3 - D growth of a short fatigue crack within a polycrystalline microstructure studied using combined diffraction and phase

نویسندگان

  • Michael Herbig
  • Andrew King
  • Péter Reischig
  • Henry Proudhon
  • Erik M. Lauridsen
  • James Marrow
  • Jean-Yves Buffière
  • Wolfgang Ludwig
چکیده

X-Ray Diffraction Contrast Tomography (DCT) is a recently developed, non-destructive synchrotron imaging technique which characterizes microstructure and grain orientation in polycrystalline materials in three dimensions (3D). By combining it with propagation based Phase Contrast Tomography (PCT) it is possible to get a full picture description for the analysis of local crack growth rate of short fatigue cracks (SFCs) in 3D: the 3D crack morphology at different propagation stages, and the shape and orientation of the grains around the crack. An approach has been developed on the metastable beta titanium alloy “Ti 21S” that allows for visualization and analysis of the growth rate and crystallographic orientation of the fracture surface.

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تاریخ انتشار 2011